مؤتمر
Parametric yield-aware sign-off flow in 65/45nm
| العنوان: | Parametric yield-aware sign-off flow in 65/45nm |
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| المؤلفون: | Byung-Su Kim, Byoung-Hyun Lee, Hung-Bok Choi, Sun-Ik Heo, Jae-Rim Lee, Yong-Cheul Kim, Chul Rim, Kyu-Myung Choi |
| المصدر: | 2008 International SoC Design Conference SoC Design Conference, 2008. ISOCC '08. International. 01:I-74-I-77 Nov, 2008 |
| Relation: | 2008 International SoC Design Conference (ISOCC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424425983 9781424425990 |
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| DOI: | 10.1109/SOCDC.2008.4815576 |