مؤتمر
Extraction of the slow oxide trap density in MOS transistors using the charge pumping method
| العنوان: | Extraction of the slow oxide trap density in MOS transistors using the charge pumping method |
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| المؤلفون: | Maneglia, Y., Bauza, D., Ouisse, T. |
| المصدر: | 1995 International Semiconductor Conference. CAS '95 Proceedings Semiconductor Semiconductor Conference, 1995. CAS'95 Proceedings., 1995 International. :155-158 1995 |
| Relation: | 1995 International Semiconductor Conference. CAS '95 Proceedings |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780326474 9780780326477 |
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| DOI: | 10.1109/SMICND.1995.494886 |