مؤتمر
High endurance ultra-thin tunnel oxide for dynamic memory application
| العنوان: | High endurance ultra-thin tunnel oxide for dynamic memory application |
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| المؤلفون: | Wann, C.H.-J., Chenming Hu |
| المصدر: | Proceedings of International Electron Devices Meeting Electron devices Electron Devices Meeting, 1995. IEDM '95., International. :867-870 1995 |
| Relation: | Proceedings of International Electron Devices Meeting |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780327004 9780780327009 |
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| تدمد: | 01631918 |
| DOI: | 10.1109/IEDM.1995.499354 |