High endurance ultra-thin tunnel oxide for dynamic memory application

التفاصيل البيبلوغرافية
العنوان: High endurance ultra-thin tunnel oxide for dynamic memory application
المؤلفون: Wann, C.H.-J., Chenming Hu
المصدر: Proceedings of International Electron Devices Meeting Electron devices Electron Devices Meeting, 1995. IEDM '95., International. :867-870 1995
Relation: Proceedings of International Electron Devices Meeting
قاعدة البيانات: IEEE Xplore Digital Library