مؤتمر
Re-examination of indium implantation for a low power 0.1 /spl mu/m technology
| العنوان: | Re-examination of indium implantation for a low power 0.1 /spl mu/m technology |
|---|---|
| المؤلفون: | Bouillon, P., Benistant, F., Skotnicki, T., Guegan, G., Roche, D., Andre, E., Mathiot, D., Tedesco, S., Martin, F., Heitzmann, M., Lerme, M., Haond, M. |
| المصدر: | Proceedings of International Electron Devices Meeting Electron devices Electron Devices Meeting, 1995. IEDM '95., International. :897-900 1995 |
| Relation: | Proceedings of International Electron Devices Meeting |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780327004 9780780327009 |
|---|---|
| تدمد: | 01631918 |
| DOI: | 10.1109/IEDM.1995.499361 |