مؤتمر
Ultra low noise, PC-based measurement system for the characterization of the metallizations of integrated circuits
| العنوان: | Ultra low noise, PC-based measurement system for the characterization of the metallizations of integrated circuits |
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| المؤلفون: | Ciofi, C., De Marinis, M., Neri, B. |
| المصدر: | Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Tec Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE. 1:319-324 vol.1 1996 |
| Relation: | Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Technical Committee 7. Conference Proceedings |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780333128 9780780333123 |
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| DOI: | 10.1109/IMTC.1996.507399 |