Comparative electromigration performance of Pb Free flip chip joints with varying board surface condition

التفاصيل البيبلوغرافية
العنوان: Comparative electromigration performance of Pb Free flip chip joints with varying board surface condition
المؤلفون: Nicholls, Lou, Darveaux, Robert, Syed, Ahmer, Loo, Shane, Tee, Tong Yan, Wassick, Thomas A., Batchelor, Bill
المصدر: 2009 59th Electronic Components and Technology Conference Electronic Components and Technology Conference, 2009. ECTC 2009. 59th. :914-921 May, 2009
Relation: 2009 IEEE 59th Electronic Components and Technology Conference (ECTC 2009)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424444755
9781424444762
تدمد:05695503
23775726
DOI:10.1109/ECTC.2009.5074122