مؤتمر
Comparative study of the radiation hardness of an analog CMOS pipeline, discrete MOS transistors and interface traps in MOS capacitors
| العنوان: | Comparative study of the radiation hardness of an analog CMOS pipeline, discrete MOS transistors and interface traps in MOS capacitors |
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| المؤلفون: | Bottcher, S., Coldewey, C., Croitoru, N., Seidman, A., Vogt, H. |
| المصدر: | Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems Radiation and its effects on components and systems Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on. :50-56 1995 |
| Relation: | Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780330935 9780780330931 |
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| DOI: | 10.1109/RADECS.1995.509750 |