مؤتمر
Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller
| العنوان: | Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller |
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| المؤلفون: | Maniatakos, Michail, Karimi, Naghmeh, Tirumurti, Chandra, Jas, Abhijit, Makris, Yiorgos |
| المصدر: | 2009 27th IEEE VLSI Test Symposium VLSI Test Symposium, 2009. VTS '09. 27th IEEE. :9-14 May, 2009 |
| Relation: | 2009 27th IEEE VLSI Test Symposium (VTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9780769535982 |
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| تدمد: | 10930167 23751053 |
| DOI: | 10.1109/VTS.2009.32 |