مؤتمر
RT-Level Deviation-Based Grading of Functional Test Sequences
| العنوان: | RT-Level Deviation-Based Grading of Functional Test Sequences |
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| المؤلفون: | Fang, Hongxia, Chakrabarty, Krishnendu, Jas, Abhijit, Patil, Srinivas, Tirumurti, Chandra |
| المصدر: | 2009 27th IEEE VLSI Test Symposium VLSI Test Symposium, 2009. VTS '09. 27th IEEE. :264-269 May, 2009 |
| Relation: | 2009 27th IEEE VLSI Test Symposium (VTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9780769535982 |
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| تدمد: | 10930167 23751053 |
| DOI: | 10.1109/VTS.2009.12 |