Non-destructive current measurement for surface mounted power MOSFET on VRM board using magnetic field probing technique

التفاصيل البيبلوغرافية
العنوان: Non-destructive current measurement for surface mounted power MOSFET on VRM board using magnetic field probing technique
المؤلفون: Yoshiko Ikeda, Yoshihiro Yamaguchi, Kawaguchi, Yusuke, Masakazu Yamaguchi, Ichiro Omura, Tomokazu Domon
المصدر: 2009 21st International Symposium on Power Semiconductor Devices & IC's Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on. :65-68 Jun, 2009
Relation: 2009 21st International Symposium on Power Semiconductor Devices & IC's (ISPSD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424435258
9781424446735
تدمد:10636854
19460201
DOI:10.1109/ISPSD.2009.5158002