4H-SiC bipolar junction transistors: From research to development - A case study: 1200 V, 20 A, stable SiC BJTs with high blocking yield

التفاصيل البيبلوغرافية
العنوان: 4H-SiC bipolar junction transistors: From research to development - A case study: 1200 V, 20 A, stable SiC BJTs with high blocking yield
المؤلفون: Zhang, Qingchun, Burk, Al, Husna, Fatima, Callanan, Robert, Agarwal, Anant, Palmour, John, Stahlbush, Robert, Scozzie, Charles
المصدر: 2009 21st International Symposium on Power Semiconductor Devices & IC's Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on. :339-342 Jun, 2009
Relation: 2009 21st International Symposium on Power Semiconductor Devices & IC's (ISPSD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424435258
9781424446735
تدمد:10636854
19460201
DOI:10.1109/ISPSD.2009.5158071