دورية أكاديمية
Reliability Analysis and Optimal Redundancy for Majority-Voted Logic Circuits
| العنوان: | Reliability Analysis and Optimal Redundancy for Majority-Voted Logic Circuits |
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| المؤلفون: | Mine, Hisashi, Hatayama, Kazumi |
| المصدر: | IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. R-30(2):189-191 Jun, 1981 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189529 15581721 |
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| DOI: | 10.1109/TR.1981.5221029 |