مؤتمر
Issues involved in reuse library for design for test
العنوان: | Issues involved in reuse library for design for test |
---|---|
المؤلفون: | Carmichael, L., Damarla, T., McHugh, P., Chung, M.J. |
المصدر: | Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' AUTOTESTCON '95 AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record. :84-93 1995 |
Relation: | Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780326210 9780780326217 |
---|---|
DOI: | 10.1109/AUTEST.1995.522658 |