مؤتمر
Membrane probe technology for MCM Known-Good-Die
| العنوان: | Membrane probe technology for MCM Known-Good-Die |
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| المؤلفون: | Ueno, T., Kondoh, Y. |
| المصدر: | Proceedings., International Test Conference International test conference 1994 Test Conference, 1994. Proceedings., International. :22-29 1994 |
| Relation: | Proceedings of International Test Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780321030 9780780321038 |
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| تدمد: | 10893539 |
| DOI: | 10.1109/TEST.1994.527932 |