مؤتمر
Effects of the downsampling scheme on three-dimensional electron microscopy of single particles
| العنوان: | Effects of the downsampling scheme on three-dimensional electron microscopy of single particles |
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| المؤلفون: | Sorzano, C.O.S., Iriarte, A., Marabini, R., Carazo, J.M. |
| المصدر: | 2009 IEEE International Symposium on Intelligent Signal Processing Intelligent Signal Processing, 2009. WISP 2009. IEEE International Symposium on. :175-179 Aug, 2009 |
| Relation: | 2009 IEEE International Symposium on Intelligent Signal Processing - (WISP 2009) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424450572 9781424450596 |
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| DOI: | 10.1109/WISP.2009.5286563 |