دورية أكاديمية
Measurement of Channel Temperature in GaN High-Electron Mobility Transistors
| العنوان: | Measurement of Channel Temperature in GaN High-Electron Mobility Transistors |
|---|---|
| المؤلفون: | Joh, J., del Alamo, J. A., Chowdhury, U., Chou, T.-M., Tserng, H.-Q., Jimenez, J. L. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 56(12):2895-2901 Dec, 2009 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
|---|---|
| DOI: | 10.1109/TED.2009.2032614 |