دورية أكاديمية
Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions
| العنوان: | Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions |
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| المؤلفون: | Sierawski, B. D., Pellish, J. A., Reed, R. A., Schrimpf, R. D., Warren, K. M., Weller, R. A., Mendenhall, M. H., Black, J. D., Tipton, A. D., Xapsos, M. A., Baumann, R. C., Deng, X., Campola, M. J., Friendlich, M. R., Kim, H. S., Phan, A. M., Seidleck, C. M. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 56(6):3085-3092 Dec, 2009 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2009.2032545 |