مؤتمر
Reassessing NBTI mechanisms by ultrafast charge pumping measurement
| العنوان: | Reassessing NBTI mechanisms by ultrafast charge pumping measurement |
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| المؤلفون: | Ang, D. S., Teo, Z. Q., Ng, C. M. |
| المصدر: | 2009 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2009. IRW '09. IEEE International. :25-29 Oct, 2009 |
| Relation: | 2009 IEEE International Integrated Reliability Workshop (IRW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424439218 9781424439225 |
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| تدمد: | 19308841 23748036 |
| DOI: | 10.1109/IRWS.2009.5383040 |