دورية أكاديمية
Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains
| العنوان: | Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains |
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| المؤلفون: | Wang, L.-T., Wen, X., Wu, S., Furukawa, H., Chao, H.-J., Sheu, B., Guo, J., Jone, W.-B. |
| المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 29(2):299-312 Feb, 2010 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 02780070 19374151 |
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| DOI: | 10.1109/TCAD.2009.2035483 |