مؤتمر
Analysis of trap mechanisms responsible for Random Telegraph Noise and erratic programming on sub-50nm floating gate flash memories
| العنوان: | Analysis of trap mechanisms responsible for Random Telegraph Noise and erratic programming on sub-50nm floating gate flash memories |
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| المؤلفون: | Seidel, K., Hoffmann, R., Lohr, D. A., Melde, T., Czernohorsky, M., Paul, J., Beug, M. F., Beyer, V. |
| المصدر: | 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS) Non-Volatile Memory Technology Symposium (NVMTS), 2009 10th Annual. :67-71 Oct, 2009 |
| Relation: | 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424449538 9781424449545 |
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| DOI: | 10.1109/NVMT.2009.5429788 |