Electrical behaviour of Junctions obtained by rapid thermal annealing of BF2 implanted layers

التفاصيل البيبلوغرافية
العنوان: Electrical behaviour of Junctions obtained by rapid thermal annealing of BF2 implanted layers
المؤلفون: Polignano, M. L., Losavio, A.
المصدر: ESSDERC '92: 22nd European Solid State Device Research conference Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European. :363-366 Sep, 1992
Relation: Proceedings of the 22nd European Solid State Device Research Conference - ESSDERC '92
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0444894780
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