DRAM Cell Characterization by AC-Impedance Measurement

التفاصيل البيبلوغرافية
العنوان: DRAM Cell Characterization by AC-Impedance Measurement
المؤلفون: Muhlhoff, H.-M., Dietl, J., Kusztelan, L.
المصدر: ESSDERC '91: 21st European Solid State Device Research Conference Solid State Device Research Conference, 1991. ESSDERC '91. 21st European. :371-374 Sep, 1991
Relation: Proceedings of the 21st European Solid State Device Research Conference - ESSDERC '91
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0444890661
9780444890665
DOI:10.1016/0167-9317(91)90247-B