Modelling of Impact Ionization Current for LDD SOI MOSFETs

التفاصيل البيبلوغرافية
العنوان: Modelling of Impact Ionization Current for LDD SOI MOSFETs
المؤلفون: Pidin, S., Matsumoto, T., Terao, N., Koyanagi, M.
المصدر: ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European. :393-396 Sep, 1995
Relation: Proceedings of the 25th European Solid State Device Research Conference
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:286332182X
9782863321829