مؤتمر
Electrical characterisation of ferroelectric thin films for integration into VLSI
| العنوان: | Electrical characterisation of ferroelectric thin films for integration into VLSI |
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| المؤلفون: | Swanston, D.M., Johnson, D.J., Amm, D.T., Griswold, E., Sayer, M. |
| المصدر: | ESSDERC '90: 20th European Solid State Device Research Conference Solid State Device Research Conference, 1990. ESSDERC '90. 20th European. :273-276 Sep, 1990 |
| Relation: | 20th European Solid State Device Research Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0750300655 9780750300650 |
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