Charge Trapping in Dry and Pyrogenic Gate Oxides

التفاصيل البيبلوغرافية
العنوان: Charge Trapping in Dry and Pyrogenic Gate Oxides
المؤلفون: Severi, M., Impronta, M., Negrini, P., Vassura, S.
المصدر: ESSDERC '89: 19th European Solid State Device Research Conference Solid State Device Research Conference, 1989. ESSDERC '89. 19th European. :349-352 Sep, 1989
Relation: 19th European Solid State Device Research Conference
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0387510001
9780387510002
DOI:10.1007/978-3-642-52314-4_70