مؤتمر
Test structures for characterising the integration of EWOD and SAW technologies for microfluidics
| العنوان: | Test structures for characterising the integration of EWOD and SAW technologies for microfluidics |
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| المؤلفون: | Li, Y., Fu, Y. Q., Flynn, B. W., Parkes, W., Liu, Y., Brodie, S., Terry, J. G., Haworth, L. I., Bunting, A. S., Stevenson, J. T. M., Smith, S., Walton, A. J. |
| المصدر: | 2010 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on. :52-57 Mar, 2010 |
| Relation: | 2010 International Conference on Microelectronic Test Structures (ICMTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424469147 9781424469123 9781424469154 |
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| تدمد: | 10719032 21581029 |
| DOI: | 10.1109/ICMTS.2010.5466861 |