مؤتمر
Low-side driver's failure mechanism in a class-D amplifier under short circuit test and a robust driver device
| العنوان: | Low-side driver's failure mechanism in a class-D amplifier under short circuit test and a robust driver device |
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| المؤلفون: | Jian-Hsing Lee, Shih, J.R., Tong-Chern Ong, Kenneth Wu |
| المصدر: | 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :182-187 May, 2010 |
| Relation: | 2010 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424454303 9781424454310 9781424454297 |
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| تدمد: | 15417026 19381891 |
| DOI: | 10.1109/IRPS.2010.5488830 |