مؤتمر
Combining de-stressing and self repair for long-term dependable systems
| العنوان: | Combining de-stressing and self repair for long-term dependable systems |
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| المؤلفون: | Koal, T., Vierhaus, H. T. |
| المصدر: | 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on. :99-104 Apr, 2010 |
| Relation: | 2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424466122 9781424466115 9781424466139 |
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| DOI: | 10.1109/DDECS.2010.5491808 |