دورية أكاديمية
Threshold Voltage and Mobility Extraction by Ultrafast Switching Measurement on NBTI
| العنوان: | Threshold Voltage and Mobility Extraction by Ultrafast Switching Measurement on NBTI |
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| المؤلفون: | Hu, Y. Z., Ang, D. S., Teo, Z. Q. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(8):2027-2031 Aug, 2010 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2010.2050962 |