مؤتمر
Power-switch gate-oxide breakdown tolerance techniques for power-gated SRAM
| العنوان: | Power-switch gate-oxide breakdown tolerance techniques for power-gated SRAM |
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| المؤلفون: | Yang, Hao-I, Chuang, Ching-Te, Hwang, Wei |
| المصدر: | 2010 IEEE International Conference on Integrated Circuit Design and Technology IC Design and Technology (ICICDT), 2010 IEEE International Conference on. :102-105 Jun, 2010 |
| Relation: | 2010 IEEE International Conference on IC Design & Technology (ICICDT) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424457731 9781424457748 9781424457755 |
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| تدمد: | 23813555 |
| DOI: | 10.1109/ICICDT.2010.5510278 |