مؤتمر
Embedded at-speed testing schemes with low overhead for high speed digital circuits on multi-chip modules
| العنوان: | Embedded at-speed testing schemes with low overhead for high speed digital circuits on multi-chip modules |
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| المؤلفون: | Maier, C.A., Greub, H., Philhower, B., Steidl, S., Garg, A., Ernest, M., Carlough, S., Campbell, P., McDonald, J.F. |
| المصدر: | 1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Innovative systems in silicon Innovative Systems in Silicon, 1996. Proceedings., Eighth Annual IEEE International Conference on. :210-216 1996 |
| Relation: | 1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780336399 9780780336391 |
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| تدمد: | 10632204 |
| DOI: | 10.1109/ICISS.1996.552428 |