مؤتمر
A physically-based built-in Spice poly-Si TFT model for circuit simulation and reliability evaluation
| العنوان: | A physically-based built-in Spice poly-Si TFT model for circuit simulation and reliability evaluation |
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| المؤلفون: | Chung, S.S., Chen, D.C., Cheng, C.T., Yeh, C.F. |
| المصدر: | International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :139-142 1996 |
| Relation: | International Electron Devices Meeting. Technical Digest |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780333934 9780780333932 |
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| تدمد: | 01631918 |
| DOI: | 10.1109/IEDM.1996.553140 |