مؤتمر
A physically-based built-in Spice poly-Si TFT model for circuit simulation and reliability evaluation
| العنوان: | A physically-based built-in Spice poly-Si TFT model for circuit simulation and reliability evaluation |
|---|---|
| المؤلفون: | Chung, S.S., Chen, D.C., Cheng, C.T., Yeh, C.F. |
| المصدر: | International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :139-142 1996 |
| Relation: | International Electron Devices Meeting. Technical Digest |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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