دورية أكاديمية
Analysis and prevention of DRAM latch-up during power-on
| العنوان: | Analysis and prevention of DRAM latch-up during power-on |
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| المؤلفون: | Young-Hee Kim, Jae-Yoon Sim, Hong June Park, Jae-Ik Doh, Kun-Woo Park, Hyun-Woong Chung, Jong-Hoon Oh, Choon-Sik Oh, Seung-Han Ahn |
| المصدر: | IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 32(1):79-85 Jan, 1997 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189200 1558173X |
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| DOI: | 10.1109/4.553181 |