مؤتمر
An asynchronous scan path concept for micropipelines using the bundled data convention
| العنوان: | An asynchronous scan path concept for micropipelines using the bundled data convention |
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| المؤلفون: | Schober, V., Kiel, T. |
| المصدر: | Proceedings International Test Conference 1996. Test and Design Validity International test conference Test Conference, 1996. Proceedings., International. :225-231 1996 |
| Relation: | Proceedings International Test Conference 1996. Test and Design Validity |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780335414 9780780335417 |
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| تدمد: | 10893539 |
| DOI: | 10.1109/TEST.1996.556965 |