Stress analysis of Cu pad/solder interfaces

التفاصيل البيبلوغرافية
العنوان: Stress analysis of Cu pad/solder interfaces
المؤلفون: Wang, Zhuoru, Qin, Fei, Xia, Guofeng
المصدر: 2010 11th International Conference on Electronic Packaging Technology & High Density Packaging Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on. :515-519 Aug, 2010
Relation: 2010 11th International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424481408
9781424481415
9781424481422
DOI:10.1109/ICEPT.2010.5582668