مؤتمر
Thermal-aware reliability analysis of nanometer designs
| العنوان: | Thermal-aware reliability analysis of nanometer designs |
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| المؤلفون: | Krishnamoorthy, Srini, Venkatraman, Vishak, Apanovich, Yuri, Burd, Thomas, Daga, Anand |
| المصدر: | 19th Topical Meeting on Electrical Performance of Electronic Packaging and Systems Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on. :277-280 Oct, 2010 |
| Relation: | 2010 IEEE 19th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424468669 9781424468652 9781424468676 |
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| تدمد: | 21654107 21654115 |
| DOI: | 10.1109/EPEPS.2010.5642793 |