دورية أكاديمية
A Novel Array-Based Test Methodology for Local Process Variation Monitoring
| العنوان: | A Novel Array-Based Test Methodology for Local Process Variation Monitoring |
|---|---|
| المؤلفون: | Luo, T.-C., Chao, M. C.-T., Wu, M. S.-Y., Li, K.-T., Hsia, C. C., Tseng, H.-C., Fisher, P. A., Huang, C.-U., Chang, Y.-Y., Pan, S. C., Young, K. K.-L. |
| المصدر: | IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 24(2):280-293 May, 2011 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 08946507 15582345 |
|---|---|
| DOI: | 10.1109/TSM.2010.2095891 |