مؤتمر
In situ electrical property characterization of individual nanostructures using a sliding probe inside a transmission electron microscope
| العنوان: | In situ electrical property characterization of individual nanostructures using a sliding probe inside a transmission electron microscope |
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| المؤلفون: | Fan, Zheng, Tao, Xinyong, Li, Yiping, Yang, Yingchao, Du, Jun, Zhang, Wenkui, Huang, Hui, Gan, Yongping, Li, Xiaodong, Dong, Lixin |
| المصدر: | 2010 IEEE Nanotechnology Materials and Devices Conference Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE. :149-152 Oct, 2010 |
| Relation: | 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424488964 9781424488957 9781424488971 |
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| DOI: | 10.1109/NMDC.2010.5652591 |