مؤتمر
In situ electrical property characterization of individual nanostructures using a sliding probe inside a transmission electron microscope
العنوان: | In situ electrical property characterization of individual nanostructures using a sliding probe inside a transmission electron microscope |
---|---|
المؤلفون: | Fan, Zheng, Tao, Xinyong, Li, Yiping, Yang, Yingchao, Du, Jun, Zhang, Wenkui, Huang, Hui, Gan, Yongping, Li, Xiaodong, Dong, Lixin |
المصدر: | 2010 IEEE Nanotechnology Materials and Devices Conference Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE. :149-152 Oct, 2010 |
Relation: | 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
كن أول من يترك تعليقا!