مؤتمر
Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation
| العنوان: | Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation |
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| المؤلفون: | Zhang, Wangyang, Li, Xin, Acar, Emrah, Liu, Frank, Rutenbar, Rob |
| المصدر: | 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on. :47-54 Nov, 2010 |
| Relation: | 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424481934 9781424481927 9781424481941 |
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| تدمد: | 10923152 15582434 |
| DOI: | 10.1109/ICCAD.2010.5654349 |