Characterization of ultra-low k porous organosilica thin films

التفاصيل البيبلوغرافية
العنوان: Characterization of ultra-low k porous organosilica thin films
المؤلفون: Fu, Shuang, Qian, Ke-Jia, Ding, Shi-Jin, Zhang, Wei, Fan, Zhong-yong
المصدر: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on. :1033-1035 Nov, 2010
Relation: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424457977
9781424458004
9781424457984
DOI:10.1109/ICSICT.2010.5667532