مؤتمر
Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique
| العنوان: | Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique |
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| المؤلفون: | Basith, Iftekhar Ibne, Kandalaft, Nabeeh, Rashidzadeh, Rashid |
| المصدر: | 2010 19th IEEE Asian Test Symposium Test Symposium (ATS), 2010 19th IEEE Asian. :135-140 Dec, 2010 |
| Relation: | 2010 19th Asian Test Symposium (ATS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424488414 |
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| تدمد: | 10817735 23775386 |
| DOI: | 10.1109/ATS.2010.32 |