مؤتمر
Effect of reservoir on electromigration of short interconnects
| العنوان: | Effect of reservoir on electromigration of short interconnects |
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| المؤلفون: | Lamontagne, P., Ney, D., Wouters, Y. |
| المصدر: | 2010 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report (IRW), 2010 IEEE International. :46-50 Oct, 2010 |
| Relation: | 2010 IEEE International Integrated Reliability Workshop (IIRW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424485215 9781424485239 9781424485246 |
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| تدمد: | 19308841 23748036 |
| DOI: | 10.1109/IIRW.2010.5706484 |