مؤتمر
Test Generation Based on SVM for Analog System with a Multi-training Sets Method
| العنوان: | Test Generation Based on SVM for Analog System with a Multi-training Sets Method |
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| المؤلفون: | Long, Ting, Wang, Houjun, Long, Bing |
| المصدر: | 2010 International Conference on Computational and Information Sciences Computational and Information Sciences (ICCIS), 2010 International Conference on. :1186-1189 Dec, 2010 |
| Relation: | 2010 International Conference on Computational and Information Sciences (ICCIS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781424488148 9780769542706 |
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| DOI: | 10.1109/ICCIS.2010.293 |