Modeling the impact of return-path discontinuity on interconnects for Gb/s applications

التفاصيل البيبلوغرافية
العنوان: Modeling the impact of return-path discontinuity on interconnects for Gb/s applications
المؤلفون: Ndip, Ivan, Lobbicke, Kai, Tschoban, Christian, Topper, Michael, Guttowski, Stephan, Reichl, Herbert, Lang, Klaus-Dieter
المصدر: 2010 IEEE International Symposium on Electromagnetic Compatibility Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on. :579-584 Jul, 2010
Relation: 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781424463053
9781424463077
9781424463084
تدمد:2158110X
21581118
DOI:10.1109/ISEMC.2010.5711341