دورية أكاديمية
The Effect of Random Dopant Fluctuations on Logic Timing at Low Voltage
العنوان: | The Effect of Random Dopant Fluctuations on Logic Timing at Low Voltage |
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المؤلفون: | Rithe, R., Chou, S., Gu, J., Wang, A., Datla, S., Gammie, G., Buss, D., Chandrakasan, A. |
المصدر: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 20(5):911-924 May, 2012 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 10638210 15579999 |
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DOI: | 10.1109/TVLSI.2011.2124477 |