دورية أكاديمية

The Effect of Random Dopant Fluctuations on Logic Timing at Low Voltage

التفاصيل البيبلوغرافية
العنوان: The Effect of Random Dopant Fluctuations on Logic Timing at Low Voltage
المؤلفون: Rithe, R., Chou, S., Gu, J., Wang, A., Datla, S., Gammie, G., Buss, D., Chandrakasan, A.
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 20(5):911-924 May, 2012
قاعدة البيانات: IEEE Xplore Digital Library