مؤتمر
Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture
| العنوان: | Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture |
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| المؤلفون: | Strano, A., Gomez, C., Ludovici, D., Favalli, M., Gomez, M. E., Bertozzi, D. |
| المصدر: | 2011 Design, Automation & Test in Europe Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011. :1-6 Mar, 2011 |
| Relation: | 2011 Design, Automation & Test in Europe Conference & Exhibition (DATE 2011) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781612842080 9783981080179 9783981080186 |
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| تدمد: | 15301591 15581101 |
| DOI: | 10.1109/DATE.2011.5763109 |